The Fail-Stop Controller AE11
نویسندگان
چکیده
This work was supported by the JESSI project AE11. Abstract Using on-chip fault detection measures the Fail-Stop Controller AE11 was developed for safety critical applications aiming at high volume production of automotive and railway electronics. The trade-off between high defect coverage, short reaction time to faults and low chip area overhead results in a combination of Concurrent Checking, Built-In Self-Test and Built-In Current-Monitoring (IDDQTest).
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